Science and technological developments: article

SIMULATION OF ELECTRIC FIELD ENHANCEMENT NEAR TAPERED GOLD TIP FOR OPTICAL MICROSCOPY
M. Zohrabi
M. Salakhov
S. Kharintsev
Department of Optics and Nanophotonics, Institute of Physics, Kazan Federal University, Kazan, Russia
Journal: Science and technological developments
Tome: 93
Number: 4
Year: 2014
Pages: 42-48
Keywords: electric field enhancement, surface plasmon, tapered gold tip, localized plasmon, light confinement, hotspot, FDTD simulation, optical microscopy
Аnnotation: SIMULATION OF ELECTRIC FIELD ENHANCEMENT NEAR TAPERED GOLD TIP FOR OPTICAL MICROSCOPY